Plotting Electron Trajectories
نویسندگان
چکیده
منابع مشابه
Secondary Electron Trajectories in Scanning Tunneling Microscopy
The recently developed technique Scanning Tunneling Microscopy in the Field Emission regime (STM FE) is based on the Russell Young's topografiner technology [1]. The set-up is a no contacting device consisting of a sharp tip approached vertically to a conducting surface at variable distances and biased with a small voltage with respect to the surface (Figure 1). The system builds a junction acr...
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ژورنال
عنوان ژورنال: Nature
سال: 1949
ISSN: 0028-0836,1476-4687
DOI: 10.1038/163403a0